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Synthetic Test Systems > SMART^E 5300

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SMART^E™ 5300

General RF-Microwave Test Environment

The SMART^E™ 5300 General RF-Microwave Test Environment provides a modular approach for implementing multi-function, configurable test systems. The SMART^E™ 5300 is a completely integrated environment with all the hardware and software needed for test execution, test reporting, test analysis, calibration, diagnostic, and DUT monitoring and control. A SMART^E™ 5300 RF/microwave Test System can perform measurements that traditionally would require five or more separate RF/microwave instruments. The SMART^E™ 5300 utilizes multi-functional stimulus and response measurement hardware channels highly integrated with Digital Signal Processing software (rather than a collection of dedicated function instruments) to generate signals and perform measurements. This unique combination of integrated tests, system calibration methods, diagnostic tools and superior throughput yields the lowest total cost of test over the life cycle of the environment.

The 5300 configuration also provides emulation of many special purpose microwave instruments utilizing a single test environment:

  • RF Signal Generator
  • Spectrum Analyzer
  • Power Meter
  • Noise Figure Meter
  • Vector Signal Analyzer
  • Phase Noise Analyzer
  • RF Frequency Counter
  • Microwave Transition Analyzer
This emulation includes instrument IVI drivers which present an instrument interface to the user to facilitate legacy TPS' compatibility.
  • Software programmability of the system provides customization to match functionality and performance of legacy systems and instruments, such as the Microwave Transition Analyzer (MTA), to ensure legacy TPS' compatibility for any RF/microwave test application.
  • The SMART^E™ 5300's cutting edge performance is a result of using software configurable modules and an open system architecture utilizing the best industry standard hardware and software.
  • The SMART^E™ 5300 can be configured with variable combinations of hardware, software and system resources to provide customized features and any required test application.
  • The SMART^E™ 5300 can be utilized both as a synthetic, measurement-based test environment and to emulate any current or legacy instruments utilizing the same test environment and hardware and software resources.







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