| DATE: 26th October 2000 | REF:
PR180 |
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OEM Agreement With JTAG Technologies Adds Boundary-Scan Capability To IFR’s 4200 ATE Test System
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| Stevenage,
UK – October 26, 2000
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IFR Limited and JTAG Technologies B.V. have entered an OEM agreement
under which JTAG’s boundary-scan technology has been added to IFR’s
4200 ATE test system.
With the increase in printed circuit board complexity and the introduction of advanced devices with BGA packaging, the use of boundary-scan test techniques has grown. Applied by designers in the prototype stage and more recently within manufacturing for production test, boundary-scan is able to overcome the twin issues of access limitations and device complexity. IFR’s 4200 ATE test system now includes the ability to use to JTAG Technologies’ boundary-scan application files. Boundary-scan applications created with development packages purchased from JTAG Technologies can be executed directly on the 4200. Using a single fixture, the system is able to execute conventional test techniques as well as boundary-scan to provide both enhanced testing and device programming. A particularly important aspect is the ability to program FLASH devices through the boundary-scan test access port, a capability being demanded by more and more customers. "Many companies have highlighted the need to be able to use the same boundary-scan application files at both the design and manufacturing stage", stated Peter van den Eijnden, director at JTAG Technologies B.V.. "By combining our software and IFR’s testers we have delivered a capability which will benefit many of our mutual customers." JTAG Technologies’ boundary-scan execution software and hardware is available immediately as an option for all new 4200 Series customers and for the majority of existing users. "Our relationship with JTAG is a reflection of our ongoing development policy", said Paul Hill, IFR’s ATE Product Manager. "Our aim is to constantly introduce new capabilities matching our customer’s requirements and technology advances." About IFR Founded in 1968, IFR Inc (Nasdaq: IFRS) is a leading designer and manufacturer of electronic test instruments for wireless communications, avionics, and general test and measurement applications. IFR offers one of the broadest test and measurement product portfolios in the industry. Its Automatic Test Equipment (ATE) can verify product quality at a number of stages ranging from printed circuit board through to final test prior to shipping and its general test and measurement solutions range from rugged and field-proven spectrum analysers and precision signal sources used in the design lab, to sophisticated instruments for production testing. About JTAG Technologies JTAG Technologies, with corporate headquarters in Eindhoven, The Netherlands, is the global leader in innovative boundary-scan (IEEE Standard 1149.1) products. The company offers a broad line of software tools and hardware supporting test preparation, test execution, test result analysis and in-system programming applications. The company also maintains offices in the United Kingdom and the United States and is represented by a global network of trained distributors and representatives throughout North America, Europe, Asia, the Middle East, and Australia. Additional information about JTAG can be found on the Web at http://www.jtag.com |
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US Media Contacts |
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European Media Contacts |
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Keith Mason / Ann Williams Harvard Public Relations +44 (0) 20 8759 0005 keith@harvard.co.uk / ann@harvard.co.uk |