Device Screening and Element Evaluation
Aeroflex RAD offers comprehensive screening services for your flight devices, lot conformance, and individual die element evaluation.
Onsite electrical testing equipment for memory, digital, linear and discrete devices including:
- Memory
- A/D Converters
- D/A Converters
- Microcontrollers
- References
- Op Amps
- Regulators
- Clock chips
- Diodes and Transistors
Quality
- DSCC MIL-STD-883/750 Laboratory Suitability
- ISO 9001:2008 Certification
Roadmap
- DSCC MIL-PRF-19500 Certification
|
Screening Test Method Capabilities |
| Test Description |
MIL-STD Test Methods |
| 883
|
750 |
|
Adhesion of Lead Finish |
2025 |
n/a |
|
Bond Strength |
2011 |
2037 |
|
Burn-in |
1015 |
1039 |
|
Constant Acceleration |
2001 |
2006 |
|
Die Shear |
2019 |
2017 |
|
External Visual |
2009 |
2071 |
|
Hermiticity |
1014 |
1071 |
|
Internal Visual |
2010 |
2072 |
|
Internal Visual Vapor |
1018 |
1018 |
|
Lead Integrity |
2004 |
2036 |
|
Lid Torque |
2024 |
n/a |
|
Mechanical Shock |
2002 |
2016 |
|
Moisture Resistance |
1004 |
1021 |
|
Physical Dimensions |
2016 |
2066 |
|
PIND |
2020 |
2052 |
|
Radiography X-ray |
2012 |
2076 |
|
Resistance to Solvents |
2015 |
1022 |
|
Salt Atmosphere |
1009 |
1041 |
|
Solderability |
2003 |
2026 |
|
Steady State Life |
1005 |
1026 |
|
Temperature Cycling |
1010 |
1051 |
|
Thermal Shock |
1011 |
1056 |
|
Vibration Variable Frequency |
2007 |
2056 |
