| 1022 |
Resistance to solvents |
| 1026 |
Steady-state operation life |
| 1027 |
Steady-state operation life (sample plan) |
| 1032 |
High-temperature (nonoperating) life (sample plan) |
| 1037 |
Intermittent operation life (sample plan) |
| 1038 |
Burn-in (for diodes, rectifiers, and zeners) |
| 1039 |
Burn-in (for transistors) |
| 1051 |
Temperature cycling (air to air) |
| 1054 |
Potted environment stress test |
| 1056 |
Thermal shock (liquid to liquid) |
| 1057 |
Resistance to Glass Cracking |
| 1071 |
Hermetic seal |
| 2026 |
Solderability |
| 2031 |
Resistance to soldering heat |
| 2036 |
Terminal strength |
| 2052 |
Particle impact noise detection (PIND) test |
| 2066 |
Physical dimensions |
| 2068 |
External visual for nontransparent, glass-encased,
double plug, noncavity, axial leaded diodes |
| 2071 |
Visual and mechanical examination |
| 2072 |
Internal visual transistor (pre-cap) inspection |
| 2073 |
Internal inspection for die (semiconductor diode) |
| 2074 |
Internal visual inspection (discrete semiconductor diodes) |
| 2075 |
Decap internal visual design verification |
| 2101 |
DPA procedures for diodes |
| 3001 |
Breakdown voltage, collector to base |
| 3011 |
Breakdown voltage, collector to emitter |
| 3036 |
Collector to base cutoff current |
| 3041 |
Collector to emitter cutoff current |
| 3051 |
Safe operating area (continuous dc) |
| 3061 |
Emitter to base cutoff current |
| 3066 |
Base emitter voltage (saturated or nonsaturated) |
| 3071 |
Saturation voltage and resistance |
| 3076 |
Forward-current transfer ratio |
| 3100 |
Junction temperature measurement |
| 3101 |
Thermal impedance testing of diodes |
| 3201 |
Small-signal short-circuit input impedance |
|
3206
|
Small-signal short-circuit forward-current transfer ratio
|
|
3211
|
Small-signal open-circuit reverse-voltage transfer ratio
|
|
3216
|
Small-signal open-circuit output admittance
|
|
3236
|
Open circuit output capacitance
|
|
3240
|
Input capacitance (output open-circuited or short-circuited)
|
|
3251
|
Pulse response
|
|
3401
|
Breakdown voltage, gate to source
|
|
3403
|
Gate to source voltage or current
|
|
3405
|
Drain to source on-state voltage
|
|
3407
|
Breakdown voltage, drain to source
|
|
3411
|
Gate reverse current
|
|
3413
|
Drain current
|
|
3421
|
Static drain to source on-state resistance
|
|
3423
|
Small-signal, drain to source on state resistance
|
|
4001
|
Capacitance
|
|
4011
|
Forward voltage
|
|
4016
|
Reverse current leakage
|
|
4021
|
Breakdown voltage (diodes)
|
|
4022
|
Breakdown voltage (voltage regulators and voltage-reference diodes)
|
|
4023
|
Scope display
|
|
4026
|
Forwardrecovery voltage and time
|
|
4031
|
Reverse recovery characteristics
|
|
4051
|
Small-signal reverse breakdown impedance
|
|
4066
|
Surge current
|
|
4071
|
Temperature coefficient of breakdown voltage
|
|
4081
|
Thermal resistance of lead mounted diodes
(forward voltage, switching method)
|
|
4201
|
Holding current
|
|
4206
|
Forward blocking current
|
|
4211
|
Reverse blocking current
|
|
4219
|
Reverse gate current
|
|
4221
|
Gate-trigger voltage or gate-trigger current
|
|
4226
|
Forward "on" voltage
|
